Language: English

校園入口網

Login

Languages

Chinese (3)

Jump To : Overview | Titles | Subjects

張仁平

Overview

Works:	1 works in 3 publications in 1 languages

Titles

發明專利實體審查基準 = Guidelines for substantive examination of invention patent by: 謝銘洋; 張仁平 (Language materials, printed) , [編著]

發明專利實體審查基準 = Guidelines for substantive examination of invention patent. 一; 1. 國際法規與案例彙編; compilation of international regulations and case studies by: 謝銘洋; 張仁平 (Language materials, printed) , [編著]

發明專利實體審查基準 = Guidelines for substantive examination of invention patent. 二 by: 張仁平 (Language materials, printed) , [編著]

Subjects

專利專利- 標準標準

Change password

Login